G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive the measurement of transient thermal

the measurement of transient thermal response can be made more sensitive to the presence of voids than can the measurement of steady state thermal response

although the test procedure may prove useful in corrosion studies

SEMI半導体製造装置通信スタンダード2（SECS-II）は，インテリジェント装置とホスト間で交換するメッセージの解釈について詳細に定義している。本仕様は，日本電子工業振興協会（JEIDA）の第12委員会の協力により規定された。

SEMI PV35-0215 (technical revision) - Replaced by SEMI A1

A unique identification of manufacturer and its location has to be part of this code

G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive the measurement of transient thermalNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Specification defines the acceptance criteria for co fired, ceramic chip carriers both leaded and lead less. Referenced SEMI Standards (purchase separately) SEMI G8 Test Method for Gold Plating Quality SEMI G25 Test