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Flex Electronics Webinar Master Class Series: Power, AI, Integration, Reliability (On Demand) StdVol-Facilities Process and quality control during

$149.00

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Process and quality control during manufacturing of wafers requires continuous monitoring of waviness with a noncontact method that supports high throughput

Charged wafer and reticle surfaces attract particles (electrostatic attraction [ESA]) and increase the defect rate

• method of membrane treatment prior to the test for decreasing the adsorbing effect

isopropyl alcohol (IPA) and ultrapure water (UPW)

001% (m/m) and 1

Flex Electronics Webinar Master Class Series: Power, AI, Integration, Reliability (On Demand) StdVol-Facilities Process and quality control during

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