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AFG31151 MEM Installed option; Extends arb memory to 128Mpts/ch in Advanced mode SE high temperatures

$2014.29

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Description

high temperatures

Minimum Event Duration for 100% POI: 100 μs

73 mm x 163

10fA resolution5½-digit resolution<200μV burden voltageAlternating Voltage method ohms measurementsAutomated voltage sweeps for I-V characterizationFloating measurements up to 500VUp to 1000 readings/secondAnalog outputDigital I/O

40 channels for generalpurpose measurements

AFG31151 MEM Installed option; Extends arb memory to 128Mpts/ch in Advanced mode SE high temperatures

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