G08100 - SEMI G81 - Specification for Map Data Items StdDcs-Current transmittance

transmittance

Field sequential color technique in the flat panel display has become more and more important

The grid described is referenced to the center of the wafer

SEMI G29 — Test Method for Trace Contaminants in Molding Compounds

2 to 20 mm and within the fixed quality area (FQA)

G08100 - SEMI G81 - Specification for Map Data Items StdDcs-Current transmittanceThis Document describes the data items that relate to electronic substrate mapping. This Document applies only to substrate map data items. This Document does not address the transmission, file naming conventions, storage or archiving of substrate maps. The Specification of which data items are optional and which are required is not specified in this Document. The size of each data item described in this Document is maximum size. The actual size may