G02000 - SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only) Revision:SEMI G20-96 - Inactive Subordinate Standard:

Subordinate Standard:

SEMI M51 — Test Method For Characterizing Silicon Wafers by Gate Oxide Integrity

FPDプロセスのすべての工程に適用できる。データマトリクスコードのフォーマットとアルゴリズムは，ISO/IEC 16022に規定された二次元記号表示に準拠している。

1-0324 (Reapproved 0524)

it is not applicable to pipeline gases

G02000 - SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only) Revision:SEMI G20-96 - Inactive Subordinate Standard:This specification defines lead finishes for plastic packages (e. g., single in line, dual in line, quad in line) using leadframes with SEMI specified leadframe materials. Referenced SEMI Standards SEMI G4 Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes SEMI G18 Specification for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes SEMI G55 Test Method Measurement of