JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working L x W x H
$305.10
Description
L x W x H =
Model No: EP200Mmd
Removed from a Nikon NSR-S307E DUV Scanning System This Nikon RBP-M16/MX4B1 Backplane Board PCB is used working surplus
Estimated Packed Shipping Dimensions: 8” x 8” x 8” @ 2-3 lbs
5080-192750-12: X-AXIS
JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working L x W x HJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items
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