F07700 - SEMI F77 - 腐食性のガスシステムに使用される合金表面の電気化学的臨界孔食温度のテスト方法 StdPbc-0309 The metrology industry is building

The metrology industry is building tools that will measure and map surface features at nanotopography amplitudes and spatial wavelengths

The oxygen concentration obtained using this Test Method assumes a linear relationship between the interstitial oxygen concentration and the absorption coefficient of the 1107 cm1 band associated with interstitial oxygen in silicon

This Specification is not intended for material used for manufacturing thin film solar products such as amorphous or micromorphous Si products

orgで。初版は1981年，前版は2001年11月に発行された。

SEMI D74-0116 (first published)

F07700 - SEMI F77 - 腐食性のガスシステムに使用される合金表面の電気化学的臨界孔食温度のテスト方法 StdPbc-0309 The metrology industry is buildingglobal Gases Committee20091216global Audits and Reviews Subcommittee20102www. semi. org20037 CPT ASTM G150 4. 1SEMI 4. 1 Referenced SEMI Standards None.