G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded and the statistical calculations of

and the statistical calculations of the results should remain consistent with the procedures of this Practice

4  This Specification defines a way for users to make ad hoc

are insufficiently established to allow an unambiguous specification

SEMI D32 — Specification for Improved Information Management for Glass FPD Substrates through Orientation Corner Unification

SEMI G15-93 (Reapproved 0811)

G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded and the statistical calculations ofNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This procedure will define a standard process whereby any logic integrated circuit (IC) automatic test equipment (ATE) system can be evaluated for parameters that makeup an alternating current (AC) timing accuracy