Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced) Ingestion-build-48974 NOTE 3: This British Standard

NOTE 3: This British Standard is not applicable to the following which are considered inappropriate for such use

Cone diameter tolerance (TD)

Type LSH-PC simplex terminated on IEC 60793-2-50 category B1

IEC 60901:1987

file-systems and databases)

Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced) Ingestion-build-48974 NOTE 3: This British StandardWhat is BS EN 60749 31 Plastic encapsulated devices about? BS EN 60749 31 is an international standard that focuses on mechanical and climatic test methods for semiconductor devices. BS EN 60749 31 establishes mechanical and climatic test methods for semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device. Note: BS EN 60749 31 is identical