Semiconductor devices. Mechanical and climatic test methods - High temperature operating life Ingestion-build-209418 preferred climatic categories

preferred climatic categories

synchronization signals and functional signals between the image processing board of the PDP set and the control board of the PDP module

BS EN 13981-4 specifies particular requirements regarding qualification

L2 and pulling sensitivity S as described in 2

Maintenance and repair conditions are not considered

Semiconductor devices. Mechanical and climatic test methods - High temperature operating life Ingestion-build-209418 preferred climatic categories1 Scope This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn in, may be used to screen for infant mortality related failures. The detailed use and application of burn in