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Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods Ingestion-build-52208 PD IEC TR 62809:2019 supersedes
Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods Ingestion-build-52208 PD IEC TR 62809:2019 supersedes
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Description
PD IEC TR 62809:2019 supersedes PD IEC/TR 62809:2013
This document specifies a method for the determination of bending stiffness using the resonance method
and to some extent their interpretation
BS EN 15561 on total nitrogen in calcium cyanamide applies to:
Redrawn figures
Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods Ingestion-build-52208 PD IEC TR 62809:2019 supersedes1 Scope This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
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