Electronic components. Long-term storage of electronic semiconductor devices - Die and wafer devices Ingestion-build-126766 EN 50281-2-1

EN 50281-2-1

Mobile cranes covered by EN 13000

BS EN 60444-11 is the 11th part of a multi-series standard used for the Measurement of quartz crystal unit parameters

In this Part 2 of the standard

PAS 197 sets out a series of recommendations relating to management and good practice in the field

Electronic components. Long-term storage of electronic semiconductor devices - Die and wafer devices Ingestion-build-126766 EN 50281-2-11 Scope This part of IEC 62435, is applicable to long term storage of die and wafer devices and establishes specific storage regimen and conditions for singulated bare die and partial or complete wafers of die including die with added structures such as redistribution layers and solder balls or bumps or other metallisation. This part also provides guidelines for special requirements and primary packaging that contain the die or wafers for handling