Semiconductor devices. Mechanical and climatic test methods - High temperature operating life Ingestion-build-47934 left-hand thread

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Semiconductor devices. Mechanical and climatic test methods - High temperature operating life Ingestion-build-47934 left-hand thread1 Scope This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn in, may be used to screen for infant mortality related failures. The detailed use and application of burn in