Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 Assessment of uncertainties in the

Assessment of uncertainties in the derived performance parameters at Location 2

Mobility-impaired people

BS EN 599-2 is used in conjunction with EN 599-1

detection of offenders and a reduction in crime

9 Tag definitions

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 Assessment of uncertainties in the1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and