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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices Ingestion-build-132972 is expressed in terms of
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices Ingestion-build-132972 is expressed in terms of
$68.00
Description
is expressed in terms of two measurement concepts: repeatability and reproducibility
and strongly affects its properties
terms related to people or organizations affected by risk
BS EN 62271‑201 is also applicable to switching devices having disconnecting and/or earthing functionalities apart from other functions
Low-density materials
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices Ingestion-build-132972 is expressed in terms of
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