Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis Ingestion-build-51747 and similar devices and combinations

and similar devices and combinations of these devices that record

Determination of shear adhesion strength of reaction resin adhesives

at the lowest permissible operating temperature on damaged (precracked) chains

NOTE For tab washers for use with Unified hexagons see BS SP 107-112 “Tab washers for use with Unified hexagons for aircraft”

Information technology - CDIF transfer format - Part 2: Syntax SYNTAX

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis Ingestion-build-51747 and similar devices and combinations1 Scope This International Standard specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle resolved XPS, XPS sputter depth profiling, peak shape analysis, and variable photon energy XPS.